Genetics of yield and panicle components in grain sorghum hybrids

Goyal, S.N. and Joshi, P. (1984) Genetics of yield and panicle components in grain sorghum hybrids. The Indian Journal of Genetics and Plant Breeding, 44 (1). pp. 96-101.

[img] PDF
Restricted to ICRISAT researchers only


Five generations (P1,P2, F1, F2, and F3,) of eight sorghum hybrids were studied for determining the gene effects following five parameter model of Hayman (1958). Heterosis for grain yield was highest in CSH 2 followed by CSH 1, CSH 5 and CSH 6. In general, magnitude of inbreeding depression in F2 and F3 generations was associated with the magnitude of heterosis. Heterosis for grain yield could arise from different mechanisms. Preponderanc of dominance (h) was observed for grain yield as well as for panicle components. However, in CSH 2 additive (d'), additive x additive (i) and dominance x dominance (i) components for yield and yield contributory characters were more important whereas in CSH 6, d' and i were effective in increasing the yield. In CSH 5 the components h and l were in the same direction indicating duplicate type of epistasis. The complementary type of epistasis for grain yield was observed in other hybrids

Item Type: Article
Author Affiliation: Department of Genetics & Plant Breeding R.C.A., University of Udaipur, Udaipur-313 101
Subjects: Crop Improvement > Genetics/Genomics
Crop Improvement > Plant Breeding
Divisions: Sorghum
Depositing User: Ms K Syamalamba
Date Deposited: 25 Mar 2013 10:35
Last Modified: 25 Mar 2013 10:35
Official URL:

Actions (login required)

View Item View Item