Genetic variation for grain yield and related traits in sorghum introgression populations

Cox, T.S. and Frey, K.J. (1984) Genetic variation for grain yield and related traits in sorghum introgression populations. Theoretical and Applied Genetics, 68 (1-2). pp. 145-153.

[img] PDF
Restricted to ICRISAT researchers only


Each of two sorghum (Sorghum bicolor (L.) Moench) cultivars were crossed with representatives of three wild sorghum races. Backcross-derived sorghum populations containing 3.125 to 50% wild germplasm were evaluated for grain yield, 100-kernel weight, days to flower, and plant height. Population means increased linearly with backcrossing for kernel weight, increased curvilinearly for grain yield, decreased curvilinearly for plant height, and changed erratically for days to flower. For all traits, the relationship between genetic variance and level of backcrossing deviated significantly from that expected based on an additive model. Genetic variance usually reached a maximum in the BC1 or BC2. The BC1 genetic variance for grain yield, averaged over matings, was twice as large as the average BC0 genetic variance. An epistatic model involving gene regulation is proposed as a plausible explanation for the results

Item Type: Article
Author Affiliation: USDA-ARS, Agronomy Department, Kansas State University, Manhattan, KS 66506, USA
Subjects: Crop Improvement > Genetics/Genomics
Crop Improvement > Plant Breeding
Divisions: Sorghum
Depositing User: Ms K Syamalamba
Date Deposited: 01 Apr 2013 10:44
Last Modified: 01 Apr 2013 10:44
Official URL:

Actions (login required)

View Item View Item