A positive regression of yield on maturity in sorghum

Dalton, L.G. (1967) A positive regression of yield on maturity in sorghum. Crop Science, 7 (3). p. 271.

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Abstract

A positive regression between high yields and late maturity is demonstrated for grain sorghum. This regression should be considered when hybrid performance is tested. The use of this high yield-late maturity relationship should assist in the detection of the more productive hybrids at all levels of maturity.

Item Type: Article
Author Affiliation: Plant Breeder, Pioneer Sorghum Company, Box 788, Plainview, Texas
Subjects: Crop Improvement
Divisions: Sorghum
Depositing User: Sandhya Gir
Date Deposited: 21 Oct 2010 09:28
Last Modified: 21 Oct 2010 09:55
Official URL: http://dx.doi.org/10.2135/cropsci1967.0011183X0007...
URI: http://eprints.icrisat.ac.in/id/eprint/240

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