Effect of soft electron treatment on adzuki bean weevil, Callosobruchus chinensis (L.) (Col., Bruchidae)

Rami Reddy, P.V. and et al, . (2006) Effect of soft electron treatment on adzuki bean weevil, Callosobruchus chinensis (L.) (Col., Bruchidae). Journal of Applied Entomology, 130 (6-7). pp. 393-399.

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Laboratory experiments were conducted to study the effect of soft electron (low-energy electron) treatment on adzuki bean weevil, Callosobruchus chinensis (L.), a major pest of stored legume seeds. Adzuki bean (Vigna angularis) seeds containing weevils of different ages (0, 2, 4, 6, 8, 10, 12, 14, 16 and 18 days), were exposed to electrons at an acceleration voltage of 170 kV for 20 min (10 kGy). The radiation sensitivity of the insect decreased with increasing age. The egg stage was highly susceptible to electron radiation whereas the 18-day-old stage (fully developed adults ready for emergence) was the most tolerant, and treatment at a higher energy (200 kV equal to 10 kGy) was necessary to achieve an 80% mortality of this stage. However, the longevity, fecundity and fertility of the surviving adult insects were adversely affected by the electron treatment and they failed to complete their life cycle. The sex ratio of weevils was not significantly affected by the electron treatment, suggesting an equal vulnerability of both sexes. Electron treatment did not affect the germination capacity of adzuki bean seeds, so soft electron irradiation represents a safer method for the disinfestation of adzuki beans.

Item Type: Article
Uncontrolled Keywords: adult emergence;low-energy electrons;radiation;seed germination;sterility;storage pest
Author Affiliation: Indian Institute of Horticultural Research, Bangalore, India; National Food Research Institute, Tsukuba, Ibaraki, Japan
Subjects: Plant Protection
Crop Improvement
Divisions: General
Depositing User: Mr. SanatKumar Behera
Date Deposited: 12 Mar 2012 05:17
Last Modified: 12 Mar 2012 05:18
Official URL: http://dx.doi.org/10.1111/j.1439-0418.2006.01074.x
URI: http://eprints.icrisat.ac.in/id/eprint/3781

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